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CONVERSION STRUCTURE AND IMAGE SENSOR ASSEMBLY
专利权人:
ARCHITEK MATERIAL CO.; LTD.
发明人:
HO, SHU LIN,何树林,何樹林,TANG, PAO YUN,汤宝云,湯寶雲,YANG, KEI HSIUNG,杨界雄,楊界雄
申请号:
TW102200912
公开号:
TWM454826U
申请日:
2013.01.15
申请国别(地区):
TW
年份:
2013
代理人:
摘要:
An electromagnetic-radiation-wave conversion structure consists of a substrate, a plurality of electromagnetic wave conversion units forming a two-dimensional array, a reflective film and a plurality of reflective layers. The substrate has a first surface and a second surface disposed opposite to the first surface. The second surface consists of a plurality of trenches formed in the body of the substrate. Each of the electromagnetic wave conversion units is disposed in each of the trenches, which is used to absorb a first electromagnetic wave with a first wavelength and to emit a second electromagnetic wave with a second wavelength. The first wavelength is shorter than the second wavelength. The reflective film, which is transparent or semi-transparent to the first electromagnetic wave, covers the first surface of the substrate and is used to reflect the second electromagnetic wave. Each of the reflective layers used to reflect the second electromagnetic wave is disposed on the side-wall of each trench of the corresponding electromagnetic wave conversion unit.一種轉換結構,包括一基板、複數個電磁波轉換單元、一反射膜以及複數個反射層。基板具有彼此相對之一第一表面與一第二表面,且第二表面具有複數個呈現二維陣列之凹槽。電磁波轉換材料係分別被設置於各凹槽內形成電磁波轉換單元,其中電磁波轉換單元係用於吸收具有第一電磁波波長之第一電磁波,並放射出具有第二電磁波波長之第二電磁波,且第一電磁波波長小於第二電磁波波長。反射膜係覆蓋於基板之第一表面上,其中第一波長之電磁波係穿透反射膜,且反射膜用於反射第二波長之電磁波。各反射層用於反射第二波長之電磁波。10‧‧‧基板20‧‧‧凹槽21‧‧‧轉換單元22‧‧‧第二表面24‧‧‧第一表面26‧‧‧反射膜30‧‧‧反射層32‧‧‧電磁波轉換單元60‧‧‧偵測區100‧‧‧轉換結構200‧‧‧影像偵測裝置300‧‧‧光偵測裝置
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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