A post processing system for electrical impedance tomography (EIT) images includes a processing device and a post processing device, and the post processing device is coupled to the processing device. The processing device is configured to generate a first EIT image through a solving method based on the measuring data. The measuring data is measured by an electrical impedance tomography instrument. The post processing device is configured to receive the first EIT image and post-process the first EIT image through a neural network algorithm to generate a second EIT image. The neural network algorithm is a feed forward neural network, a recurrent neural network, a convolutional neural network or a deep neural network, and an accuracy of the second electrical impedance tomography image is higher than an accuracy of the first electrical impedance tomography image.
