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Adjustable photon detection systems for multi-slice X-ray computed tomography systems
专利权人:
Zhengrong Ying
发明人:
Zhengrong Ying
申请号:
US13760127
公开号:
US09285327B2
申请日:
2013.02.06
申请国别(地区):
US
年份:
2016
代理人:
摘要:
An Adjustable Photon Detection System (APDS) for multi-slice X-ray CT systems and a multi-slice X-ray CT system using the APDS are disclosed wherein the APDS can be adjusted to be aligned to different X-ray source positions wherein the multi-slice X-ray CT system comprises one or more X-ray sources, and one or more APDS wherein the multi-slice X-ray CT system may also include a detector position calculator for calculating effective detector positions and a detector position corrector for correcting projection data using calculated effective detector positions.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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zhengrong ying
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