Markus DURZINSKY,Marc Andreas MÖRIG,Sebastian KÖNIG
申请号：
US16484348
公开号：
US20200000417A1
申请日:
2018.02.05
申请国别(地区):
US
年份:
2020
代理人:
摘要：
A production method for test X-ray includes preparation (S10) of first CT data (B) of an inspection object, second CT data (BM) for metal portions of the inspection object, and third CT data (TM) for metal portions of a target object, transformation (S20) of the first, second, and third CT data (B, BM, TM) from the image space (BR) into corresponding first sinogram data (SB), second sinogram data (SBM), and third sinogram data (STM) in the radon space (RR), calculation (S30, S40) of the artifact sinogram data (SA), back-transformation (S50) of the artifact sinogram data (SA) from the radon space (RR) into the image space (BR) in CT artifact data (A) for the artifacts that are to be inserted, and insertion of the CT artifact data (A) into the first CT data (B).
