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Apparatus and Method for Detecting Surface Topography
专利权人:
Advanced Optical Technologies Ltd;ADOM
发明人:
Yoel Arieli,Yoel Cohen,Shlomi Epstein,Dror Arbel,Ra'anan Gefen,Raanan Gefen
申请号:
US15802829
公开号:
US20180070813A1
申请日:
2017.11.03
申请国别(地区):
US
年份:
2018
代理人:
摘要:
Apparatus and methods are described, for detecting the surface topography of a portion of a curved surface of an object. A beam of light is directed toward the surface from a broad angle of incidence with respect to an optical axis of a camera. Light reflected from the surface is received by the camera, via a narrow-angle aperture. One or more darkened regions in the received light are detected, and the surface topography of portion of the surface is detected at least partially in response to the detected darkened regions. Other applications are also described.
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http://www.ckcest.cn/home/
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