Methods are disclosed for removal of outlier pixels from a transmission electron microscopy camera image. One exemplary method includes establishing a desired exposure of n electrons per pixel exposing the camera to a series of sub-frame exposures to produce a series of sub-frame images calculating an average image signal of all sub-frame exposures in said series establishing a threshold selected to achieve a desired number of false positives evaluating each of said sub-frame exposures for pixels further away from said average than said threshold and replacing pixels in each of said sub-frame images that exceed said threshold with said average to form corrected sub-frame images.
