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PARTICLE BEAM IRRADIATION SYSTEM AND CONTROL METHOD FOR PARTICLE BEAM IRRADIATION SYSTEM
专利权人:
MITSUBISHI ELECTRIC CORPORATION
发明人:
HARADA HISASHI
申请号:
EP10852156
公开号:
EP2579265A4
申请日:
2010.05.27
申请国别(地区):
EP
年份:
2013
代理人:
摘要:
There is provided a particle beam irradiation system so as to provide the dose distribution having more accuracy. An irradiation control part (13) comprises an energy setting controller (14) that sets the energy of a charged particle beam, a beam scanning controller (16) that controls a beam scanner (41), and a beam diameter changer (15) to control a beam diameter changer (40, 60), wherein the irradiation control part (13) sets a beam diameter of the charged particle beam to be a first beam diameter by the beam diameter changer (15), the charged particle beam is scanned step-wise by the beam scanning controller (16) so as to irradiate the charged particle beam on a predetermined region or the irradiation target, after that, the beam diameter of the charged particle beam is set by the beam diameter controller (15) to be a second beam diameter that is different from the first beam diameter, and the charged particle beam is scanned step-wise by the beam scan controller (16) so as to control the charged particle beam to irradiate on a region that is overlapped with at least a part of the predetermined part of the irradiation target.
来源网站:
中国工程科技知识中心
来源网址:
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