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SYSTEMS AND METHODS FOR REGULARIZED FOURIER ANALYSIS IN X-RAY PHASE CONTRAST IMAGING
专利权人:
General Electric Company
发明人:
Jonathan Immanuel Sperl,Kinan Mahdi
申请号:
US14264689
公开号:
US20150310609A1
申请日:
2014.04.29
申请国别(地区):
US
年份:
2015
代理人:
摘要:
A method of regularization of x-ray phase contrast imaging (XPCi) system measurement data includes obtaining air scan data of the XPCi system prior to the presence of an object undergoing imaging, performing Fourier analysis of the air scan data, computing air coefficients from the result of the performing step, obtaining object scan data of an object undergoing imaging on the XPCi system, regularizing the object scan data, and calculating at least one of absorption image data, differential phase image data, and dark field image data by using object coefficients. A system configured to implement the method and a non-transitory computer-readable medium are disclosed.
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