DYNAMIC MODELING OF IMPERFECTIONS FOR PHOTON COUNTING DETECTORS
- 专利权人:
- 发明人:
- 申请号：
- EP13759003.0
- 公开号：
- EP2866663B1
- 申请日:
- 2013.06.20
- 申请国别(地区):
- EP
- 年份:
- 2016
- 代理人:
- 摘要：
- An apparatus (T) and method for correcting detector (104) measurement data for errors caused by imperfections in the detector (104) that effect the accuracy of the detector readings.
- 来源网站：
- 中国工程科技知识中心
相关发明人
相关专利
- 光子計数検出装置のための不完全性の動的モデリング
- Dynamic modeling of imperfections for photon counting detectors
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- СИСТЕМА И СПОСОБ ДЛЯ ОПРЕДЕЛЕНИЯ ИНФОРМАЦИИ О ПОКАЗАТЕЛЯХ ЖИЗНЕННО ВАЖНЫХ ФУНКЦИЙ СУБЪЕКТА
