Removal of artifacts from an EM field generator from a 3D scan

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专利权人:

发明人:

Ameet Kumar Jain,Raymond Chan

申请号：

US14364431

公开号：

US09235908B2

申请日:

2012.12.27

申请国别(地区):

US

年份:

2016

代理人:

摘要：

A method, system, and program product are provided for removing artifacts from an EM field generator from a rotational 3D scan. The method comprises: preoperatively, characterizing the artifacts from the EM field generator over a range of rotational positions of an x-ray source and detector intraoperatively, determining the position of the EM field generator relative to the x-ray source and detector and removing the preoperatively characterized artifacts for the determined relative position of the EM field generator from current x-ray image.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/