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MAGNETIC FIELD MEASUREMENT METHOD AND MAGNETIC FIELD MEASUREMENT APPARATUS
专利权人:
SEIKO EPSON CORPORATION
发明人:
Kimio NAGASAKA,Mitsutoshi MIYASAKA,Satoshi TAKAHASHI
申请号:
US14953122
公开号:
US20160154072A1
申请日:
2015.11.27
申请国别(地区):
US
年份:
2016
代理人:
摘要:
In a magnetic field measurement apparatus, a light source irradiates a gas cell with linearly polarized light serving as pump light and probe light in a Z axis direction, and a magnetic field generator applies alternating magnetic fields which have the same cycle and different phases to the gas cell in each of X axis and Y axis directions. A calculation controller calculates a magnetic field C (Cx, Cy, Cz) of a measurement region using X axis and Y axis components Ax and Ay of the alternating magnetic fields, and a spin polarization degree Mx corresponding to a measurement value W− from a magnetic sensor.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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