散乱放射線の割合に応じたX線検出器の利得校正

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专利权人:

コーニンクレッカ フィリップス エヌ ヴェ

发明人:

ティンメル,ヤン,ファン デ ハール,ペーテル ヘオルヘ

申请号：

JP2009520095

公开号：

JP5336364B2

申请日:

2007.07.10

申请国别(地区):

JP

年份:

2013

代理人:

摘要：

It is described a gain calibration for a two-dimensional X-ray detector (315), in which the gain coefficients for scattered radiation (307b) and direct radiation (307a) are measured or estimated separately. A weighed average may be applied on the appropriate scatter fraction. The scatter fraction depending gain calibration method produces less ring artifacts in X-ray images as compared to known gain calibration methods, which do not take into account the fraction of scattered radiation reaching the X-ray detector (315).

来源网站：

中国工程科技知识中心

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http://www.ckcest.cn/home/