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Performance curve generation for non-destructive testing sensors
专利权人:
JENTEK SENSORS, INC.
发明人:
Goldfine Neil J.,Sheiretov Yanko K.,Spencer Floyd W.,Jablonski David A.,Grundy David C.,Schlicker Darrell E.
申请号:
US201213451128
公开号:
US10001457(B2)
申请日:
2012.04.19
申请国别(地区):
美国
年份:
2018
代理人:
Hamilton, Brook, Smith & Reynolds, P.C.
摘要:
Methods and apparatus for enhancing performance curve generation, damage monitoring, and improving non-destructive testing performance. Damage standards used for performance curve generation are monitored using a non-destructive testing (NDT) sensor during a damage evolution test performed with the standard. The evolution test may be intermittently paused to permit ground truth data to be collected in addition to the NDT sensor data. A damage evolution model may be used to estimate ground truth data during the intervening periods of the damage evolution test. The NDT sensor data and ground truth data are used to generate performance curves for the NDT system. Multiple sensors may be monitored at multiple locations on the damage standard and multiple damage evolution tests may be performed with multiple damage standards.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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