An imaging system may include a radiation source for emitting radiation, a radiation detector having a regular arrangement of detector elements, and a shadow mask having a regularly repeating pattern. The shadow mask and the radiation detector may be arranged such that a projection of the pattern of the shadow mask is generated at the location of the detector by the radiation. A spatial repetition length of the projection of the pattern may differ from twice a spatial repetition length of the arrangement of the detector elements. Such imaging system may be used, for example, with the aid of the radiation detector, to measure the displacement of the projection of the pattern of the shadow mask at the location of the radiation detector which is effected by an object to be examined.
