Wenbing Yun,Sylvia Jia Yun Lewis,Janos Kirz,Alan Francis Lyon
申请号：
US14943445
公开号：
US10349908B2
申请日:
2015.11.17
申请国别(地区):
US
年份:
2019
代理人:
摘要：
An x-ray interferometric imaging system includes an x-ray source with a target having a plurality of discrete structures arranged in a periodic pattern. The system further includes a beam-splitting x-ray grating, a stage configured to hold an object to be imaged, and an x-ray detector having a two-dimensional array of x-ray detecting elements. The object is positioned between the beam-splitting x-ray grating and the x-ray detector, the x-ray detector is positioned to detect the x-rays diffracted by the beam-splitting x-ray grating and perturbed by the object to be imaged.
