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Exposure apparatus including a mask holding device which holds a periphery area of a pattern area of the mask from above
专利权人:
发明人:
Yuichi Shibazaki
申请号:
US14245050
公开号:
US09575417B2
申请日:
2014.04.04
申请国别(地区):
US
年份:
2017
代理人:
摘要:
An exposure apparatus which transfers a pattern formed on a mask onto a photosensitive substrate placed in proximity to the mask, the apparatus including an illumination optical device which illuminates the mask with an energy beam, a mask holding device which holds a periphery area of a pattern area of the mask from above, and makes a force at least within a plane parallel to a predetermined plane act on the mask and a substrate holding device which moves along the predetermined plane holding the substrate.
来源网站:
中国工程科技知识中心
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http://www.ckcest.cn/home/

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