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荷電粒子線治療装置及び荷電粒子線治療装置の制御方法
专利权人:
住友重機械工業株式会社
发明人:
浅羽 徹
申请号:
JP2014038628
公开号:
JP6215086B2
申请日:
2014.02.28
申请国别(地区):
JP
年份:
2017
代理人:
摘要:
PROBLEM TO BE SOLVED: To suppress worsening of uniformity in a dose distribution even if an error in exposure position of a charged particle beam occurs.SOLUTION: A charged particle radiotherapy device 1 that uses a scanning method to expose a tumor 14 to a charged particle beam B comprises: an exposure unit 2 that exposes the tumor 14 to the charged particle beam B in accordance with a scanning pattern and a control unit 7 that controls the exposure unit 2 on the basis of the scanning pattern. When the exposure unit 2 executes at least two exposures within the same layer set to the tumor 14, the control unit 7 controls the exposure unit 2 on the basis of the scanning pattern displaced per exposure.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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