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Method for measuring scattering absorber and device for measuring scattering absorber
专利权人:
Kenji Yoshimoto
发明人:
Kenji Yoshimoto,Kazuyoshi Ohta,Daisuke Yamashita,Hiroaki Suzuki
申请号:
US13130117
公开号:
US08700349B2
申请日:
2009.09.01
申请国别(地区):
US
年份:
2014
代理人:
摘要:
In a method for measuring a scattering medium, pulse light with a predetermined wavelength is made incident on a scattering medium which is a measurement object and a scattering medium for reference, the pulse light transmitted inside the scattering media is detected to acquire a light detection signal, the measurement waveform is acquired on the basis of the detected light detection signal, a parameter of a function showing the theoretical waveform of the measurement object is specified in such a manner that the result of convolution operation on the theoretical waveform of the measurement object and the measurement waveform of the reference is made equal to the result of convolution operation on the theoretical waveform of the reference and the measurement waveform of the measurement object, and calculation is made for the internal information of the scattering medium on the basis of the theoretical waveform shown by the function.
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