DUAL ENERGY DIFFERENTIAL PHASE CONTRAST IMAGING

• 收藏
• 分享

专利权人:

KONINKLIJKE PHILIPS N.V.

发明人:

Gerhard MARTENS,Udo VAN STEVENDAAL

申请号：

US15511362

公开号：

US20180153486A1

申请日:

2016.08.26

申请国别(地区):

US

年份:

2018

代理人:

摘要：

A grating based interferometric X-ray imaging apparatus having an interferometer (IF). The interferometer comprises at least one grating (G1). The grating (G1) is tiltable relative to an optical axis of the X-ray imaging apparatus. This allows changing a design energy of the X-ray imaging apparatus.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/