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Pseudo dual-energy material identification system and method with undersampling
专利权人:
Li Zhang
发明人:
Li Zhang,Zhiqiang Chen,Yuanyuan Liu,Yuxiang Xing,Ziran Zhao
申请号:
US13322242
公开号:
US08831305B2
申请日:
2009.12.30
申请国别(地区):
US
年份:
2014
代理人:
摘要:
Pseudo dual-energy material identification systems and methods with under-sampling are disclosed. The system comprises a ray generating device, a mechanic rotation control section, a data collecting subsystem comprising a first tier of detectors and a second tier of detectors, and a master control and data processing computer. The system utilizes a CT-imaging-based material identification method with under-sampled dual-energy projection data, in which only a few detectors at the second tier are used to perform dual-energy projection data sampling, and optimization is made on the procedure of solving an equation system.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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