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眼科装置
专利权人:
興和株式会社
发明人:
雑喉 正泰
申请号:
JP2008206379
公开号:
JP5285994B2
申请日:
2008.08.08
申请国别(地区):
JP
年份:
2013
代理人:
摘要:

PROBLEM TO BE SOLVED: To provide an ophthalmic apparatus carrying out ophthalmic inspection such as gonioscopy and funduscopy by irradiating an eye to be inspected with slit light in a simple construction.

SOLUTION: The anterior segment 1b of the eye to be inspected is irradiated with infrared slit light 73 whose longitudinal direction is directed in a substantially horizontal direction to the eye 1 to be inspected from below the eye to be inspected in a predetermined elevation angle &theta. The moving images of a cornea reflection slit image and an iris reflection slit image of the anterior segment along with the image of the anterior segment by the slit light are imaged by an imaging device 40. The still images of the anterior segment along with the respective slit images are imaged and stored in an image memory 62b as the still images when switched to the fundus imaging via a switching device 63. The cornea reflection slit image and the iris reflection slit image are extracted from the images stored in the image memory and the gonio angle is obtained. In such the constitution, the gonioscopy can be carried out during a series of actions of the funduscopy usually done.

COPYRIGHT: (C)2010,JPO&INPIT

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中国工程科技知识中心
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