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Interconnect structure and method of forming same
专利权人:
Taiwan Semiconductor Manufacturing Company; Ltd.
发明人:
Shu-Ting Tsai,Jeng-Shyan Lin,Chun-Chieh Chuang,Dun-Nian Yaung,Jen-Cheng Liu,Feng-Chi Hung
申请号:
US13866802
公开号:
US09764153B2
申请日:
2013.04.19
申请国别(地区):
US
年份:
2017
代理人:
摘要:
A semiconductor device comprises a first chip bonded on a second chip. The first chip comprises a first substrate and first interconnection components formed in first IMD layers. The second chip comprises a second substrate and second interconnection components formed in second IMD layers. The device further comprises a first conductive plug formed within the first substrate and the first IMD layers, wherein the first conductive plug is coupled to a first interconnection component and a second conductive plug formed through the first substrate and the first IMD layers and formed partially through the second IMD layers, wherein the second conductive plug is coupled to a second interconnection component.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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