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Method for generating position data of an instrument
专利权人:
Dirk Mucha
发明人:
Dirk Mucha
申请号:
US13321087
公开号:
US10398512B2
申请日:
2010.05.17
申请国别(地区):
US
年份:
2019
代理人:
摘要:
A method for detecting deformations and errors and/or for generating position data of an instrument (1) with at least one first section (2) with at least one first sensor (4) and at least one second section (3) with at least one second sensor (5), wherein the method encompasses metrologically determining the position of the first and second sensor (4, 5). The method encompasses mathematically determining the position of the second sensor (5) with regard to the first section (2), preferably in at least two ways. Further, an apparatus for executing the method is specified.
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