A measuring device and a measuring method are provided. The measuring device is used for measuring a signal to be tested provided by the object to be tested. The measuring device includes an electrode, a signal generator and a processor. A plurality of contact points of the electrode are divided into a plurality of contact point groups. The signal generator is configured to provide a plurality of measurement signals to the plurality of contact point groups respectively. The processor is configured to obtain a plurality of resistance values between the plurality of contact point groups and the object to be tested by using the plurality of measurement signals, and instruct the signal generator to correct waveforms of the plurality of measurement signals according to the plurality of resistance values.本發明提供一種測量裝置以及測量方法。測量裝置用以測量待測物所提供的待測訊號。測量裝置包括電極、訊號產生器以及處理器。電極的多個接觸點被區分為多個接觸點群。訊號產生器用以分別對上述多個接觸點群提供多個測量訊號。處理器用以當電極接觸待測物時，藉由多個測量訊號獲得多個接觸點群與待測物之間的多個電阻值，並依據上述多個電阻值指示訊號產生器修正上述多個測量訊號的波形。
