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PHASE CONTRAST IMAGING APPARATUS
专利权人:
Erik Fredenberg
发明人:
Erik Fredenberg,Magnus Aslund
申请号:
US14126214
公开号:
US20140146945A1
申请日:
2012.06.27
申请国别(地区):
US
年份:
2014
代理人:
摘要:
An x-ray imaging system comprising an x-ray source, an x-ray detector comprising a plurality of detector strips arranged in a first direction of the x-ray detector, each detector strip further comprising a plurality of detector pixels arranged in a second direction of the x-ray detector a phase grating a plurality of analyzer gratings comprising grating slits a phase grating, and a plurality of analyzer gratings comprising grating slits, wherein the x-ray source and the x-ray detector are adapted to perform a scanning movement in relation to an object in the first direction, in order to scan the object, wherein the analyzer gratings are arranged between the x-ray source and the x-ray detector, wherein each of the plurality of analyzer gratings (162) is arranged in association with a respective detector strip with the grating slits arranged in the second direction and wherein the grating slits of the analyzer gratings of the detector strips are displaced relative to each other in the second direction.
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