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QUANTIFICATION OF INHOMOGENEITIES IN OBJECTS BY ELECTROMAGNETIC FIELDS
专利权人:
OPR mikrovågsteknik ekonomisk förening
发明人:
Petrovic Nikola,Risman P O,Otterskog Magnus
申请号:
US201615774720
公开号:
US2018325413(A1)
申请日:
2016.10.20
申请国别(地区):
美国
年份:
2018
代理人:
摘要:
A system and method, as well as sub assemblies thereof, for detection of dielectric irregularities/inhomogeneities inside an object under study (OUS) be means of electromagnetic energy are disclosed. The system comprises a loop/cylinder emitter configured to be located close to the OUS with its axis of symmetry directed towards the OUS. A feeding line feeds the emitter with an alternating current at an operating frequency to cause a magnetic field therein, which in turn will induce a propagating electromagnetic field in the OUS. In order to reduce propagating fields outside of the OUS, the circumference of the emitter is smaller than the free-space wavelength corresponding to the operating frequency, and the feeding line has a characteristic impedance that is smaller than 20 Ohm.
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