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GAS ANALYSIS DEVICE AND GAS ANALYSIS METHOD
专利权人:
RIKEN
发明人:
Masaki YUMOTO,Koji MIYAZAKI,Satoshi WADA,Takayo OGAWA,Shinichi IMAI
申请号:
US15063432
公开号:
US20160331270A1
申请日:
2014.09.08
申请国别(地区):
US
年份:
2016
代理人:
摘要:
To provide a gas analysis device comprising: a cell; a light source; and a detector, wherein two or more types of gaseous components contained in the gas are measurement targets, a mid-infrared light with a wavelength that is caused to match the absorption spectrum of the measurement target gaseous components is output from the light source, and concentrations of the gaseous components are obtained based on light intensity detected by the detector. The gas analysis device sets a cumulative measurement time for the mid-infrared lights with the wavelengths for respective ones of the measurement target gaseous components; and controls at least one of an output time of the light source and a detection time of the detector in accordance with the cumulative measurement times, thereby efficiently measuring the plurality of types of gaseous components contained in the gas by using the mid-infrared lights with the plurality of wavelengths.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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