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SS OCT interferometry for measuring a sample
专利权人:
Daniel Bublitz
发明人:
Daniel Bublitz,Gerhard Krampert,Martin Hacker
申请号:
US12997804
公开号:
US08632181B2
申请日:
2009.06.12
申请国别(地区):
US
年份:
2014
代理人:
摘要:
An SS OCT interferometry device for measuring a sample, in particular from an eye. The device interferometrically generates a measuring signal and from the signal a depth-resolved contrast signal of the sample by spectral tuning of the central wavelength of the measurement radiation of a measuring signal, and has a control unit for this purpose. The device includes a sample motion detector, which provides a motion signal indicating movement of or in the sample, the control unit uses the motion signal to correct the measuring signal with respect to measuring errors that are caused by a movement of or in the sample before or during the generation of the depth-resolved contrast signal.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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