您的位置: 首页 > 农业专利 > 详情页

Skin evaluation method and skin evaluation device
专利权人:
FUJIFILM Corporation
发明人:
Naoko Yoshida,Karin Kuroiwa
申请号:
US14572523
公开号:
US10383567B2
申请日:
2014.12.16
申请国别(地区):
US
年份:
2019
代理人:
摘要:
A profile of optical reflectance relative to a depth within a depth range from an epidermis to an upper layer of a dermis is created based on a coherence signal obtained by optical coherence tomography, an evaluation index is determined by calculating a difference between reflectance at a local minimum point and reflectance at a second local maximum point from the created profile, and skin conditions are evaluated based on the evaluation index.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充