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METHODS AND SYSTEMS FOR LOCATING MARKS ON ORTHODONTIC APPLIANCES
专利权人:
Ormco Corporation
发明人:
Mithil J. Shah,Yevgeniy Sirovskiy,Wayne R. Murphy,Gopal Biswas
申请号:
US16362118
公开号:
US20200297457A1
申请日:
2019.03.22
申请国别(地区):
US
年份:
2020
代理人:
摘要:
A computer-implemented method for marking an object on an aligner. The aligner surface is modeled. The method includes calculating a normal for each tile in a tessellated surface and disqualifying a tile from being selected. For tiles not disqualified, a patch is identified that produces a markable area. The method includes selecting an object to be marked, calculating a location of the object in the markable area, and providing the location of the object to a marking device. Disqualifying includes comparing an angle between a normal and an orientation of the beam to an origin of the calculated normal on each tile. Disqualifying includes disqualifying the at least one tile when the angle is outside of a range of −;90° to +90°. Identifying the patch includes separating the patch into at least two smaller patches, and one of the two smaller patches of tiles is the markable area.
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