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MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT METHOD
专利权人:
发明人:
Mitsutoshi MIYASAKA,Toshihiro SAITO,Akihiro DEGUCHI,Ryuji HOKARI
申请号:
US15171566
公开号:
US20160360987A1
申请日:
2016.06.02
申请国别(地区):
US
年份:
2016
代理人:
摘要:
A magnetic field measurement apparatus includes a magnetic sensor that detects a magnetic field from a subject, a table on which the subject is mounted, a shape measurement device that measures a surface shape of the subject, an average plane calculation unit that calculates an average plane of the surface shape, and a control unit that controls the table so that an opposing surface of the magnetic sensor is parallel to the average plane.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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