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Optical Measurement Device And Probe System
专利权人:
KONICA MINOLTA; INC.
发明人:
Yusuke Mimura,Yasuyuki Natsuno
申请号:
US14430125
公开号:
US20150245769A1
申请日:
2013.09.19
申请国别(地区):
US
年份:
2015
代理人:
摘要:
An optical measurement device provided with: a first adjustment optical device for collecting radiation light received by a probe that emits measurement light to a measurement target and receives radiation light radiated from the measurement target, and for emitting the radiation light toward the spectroscope for dividing the radiation light; a detection section for detecting a light intensity distribution of the radiation light; a movement part for moving the first adjustment optical device in a light axis direction of the radiation light and on a plane perpendicular to the light axis direction of the radiation light; and a control section for controlling the movement part. The first adjustment optical device is moved in the light axis direction of the radiation light and on the plane on a basis of a detection result of the detection section such that a reception amount of the radiation light increases.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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