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MEASURING INSTRUMENT ATTACHMENT ASSIST DEVICE AND MEASURING INSTRUMENT ATTACHMENT ASSIST METHOD
专利权人:
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
发明人:
Hiroshi KAWAGUCHI,Toru YAMADA
申请号:
US16500664
公开号:
US20200196963A1
申请日:
2018.04.02
申请国别(地区):
US
年份:
2020
代理人:
摘要:
A measuring instrument attachment assist device which includes: a coordinate detector which detects coordinates of predetermined feature points from an image obtained by capturing an image of a subject; a conversion parameter calculator which calculates a projection conversion parameter for converting the coordinates of the feature points in a model image into the coordinates obtained by the detection; a designating unit which designates a position of a measuring instrument attached to the subject in the model image; a coordinate converter which converts a coordinate of the position designated by using the designating unit, by using the projection conversion parameter; and a display which displays the coordinate obtained by the conversion by the coordinate converter , on the image obtained by the capturing.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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