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波面収差測定装置及びその方法
专利权人:
株式会社トプコン
发明人:
広原 陽子,山口 達夫,三橋 俊文
申请号:
JP2008274881
公开号:
JP5207916B2
申请日:
2008.10.24
申请国别(地区):
JP
年份:
2013
代理人:
摘要:

PROBLEM TO BE SOLVED: To provide an apparatus for measuring chromatic aberration of the eyes, that is, change in wavefront aberration for each wavelength.

SOLUTION: The apparatus for measuring wavefront aberration 1 includes a light source section 11 that emits light with a plurality of wavelengths in a switchable manner, an illuminating optical system 10 that changes illuminating light flux emitted from the light source section 11 into spotlight and illuminates the fundus 81 of a subject eye 80 with the spotlight, a Hartmann plate 22 that divides reflected light flux from the fundus 81 into a plurality of divided light fluxes, a light receiving optical system 20 having a light receiving section 21 for receiving the plurality of divided light fluxes divided by the Hartmann plate 22, a wavefront aberration calculating section 901 that acquires wavefront aberration for light of each wavelength received at the light receiving section 21, and a chromatic aberration calculating section 902 that acquires chromatic aberration of the wavefront on the basis of the wavefront aberration of each wavelength acquired by the wavefront aberration calculating section 901.

COPYRIGHT: (C)2010,JPO&INPIT

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