波面収差測定装置及びその方法
- 专利权人:
- 株式会社トプコン
- 发明人:
- 広原 陽子,山口 達夫,三橋 俊文
- 申请号:
- JP2008274881
- 公开号:
- JP5207916B2
- 申请日:
- 2008.10.24
- 申请国别(地区):
- JP
- 年份:
- 2013
- 代理人:
- 摘要:
PROBLEM TO BE SOLVED: To provide an apparatus for measuring chromatic aberration of the eyes, that is, change in wavefront aberration for each wavelength.
SOLUTION: The apparatus for measuring wavefront aberration 1 includes a light source section 11 that emits light with a plurality of wavelengths in a switchable manner, an illuminating optical system 10 that changes illuminating light flux emitted from the light source section 11 into spotlight and illuminates the fundus 81 of a subject eye 80 with the spotlight, a Hartmann plate 22 that divides reflected light flux from the fundus 81 into a plurality of divided light fluxes, a light receiving optical system 20 having a light receiving section 21 for receiving the plurality of divided light fluxes divided by the Hartmann plate 22, a wavefront aberration calculating section 901 that acquires wavefront aberration for light of each wavelength received at the light receiving section 21, and a chromatic aberration calculating section 902 that acquires chromatic aberration of the wavefront on the basis of the wavefront aberration of each wavelength acquired by the wavefront aberration calculating section 901.
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- 来源网站:
- 中国工程科技知识中心