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PROCÉDÉ ET SYSTÈME DE MARQUAGE XRF ET DE LECTURE DE MARQUES XRF DE SYSTÈMES ÉLECTRONIQUES
专利权人:
Security Matters Ltd.;Soreq Nuclear Research Center
发明人:
申请号:
EP17778790.0
公开号:
EP3472599A4
申请日:
2017.04.04
申请国别(地区):
EP
年份:
2020
代理人:
摘要:
Methods and systems for verifying compatibility of components of an electronic system are disclosed. The method includes irradiating a first and second components presumably associated with the electronic system, with XRF exciting radiation, and in response thereto, detecting one or more XRF response signals indicative of first and second XRF signatures, emitted from the first and second components. Then the first and second XRF signatures are processed to determine whether they are associated with respectively a first and second XRF marking compositions on the first and second components, and the compatibility of the first and second components to the electronic system is determined/verified based on the correspondence between the first and a second XRF signatures. Electronic systems are also disclosed including at least a first and a second electronic components respectively having the first and second XRF marking compositions that enable verification of compatibility of the components.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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