A device for non-destructive testing of an electrically conductive part including: an induction portion, a receiving portion, and a processor. The induction portion includes an inductor dissociated into n layers supplied at different frequencies f1, f2, . . . , fn, wherein the receiving portion includes plural magnetic receivers supplied at different frequencies f1′, f2′, . . . , fn′ connected to one another in at least one column, each magnetic receiver being positioned under a layer, the indices n and m being integers >2, and wherein the processor makes it possible to know the magnetic field in each of the magnetic receivers of a column.
