Anatoliy Parpara,Ivan Kharpalev,Stephan Albert Alexandre Dumothier,Andrey Cherkas,Alexey Kalinichenko,Jack Shaw,Israel Velazquez
申请号：
US16851038
公开号：
US20200242765A1
申请日:
2020.04.16
申请国别(地区):
US
年份:
2020
代理人:
摘要：
A system for inspecting a customized dental device associated with a dental application for manufacturing defects is disclosed. The system obtains images of the customized device and identifies an identifier of the customized device. The system determines a digital file associated with the customized device based on the identifier, the digital file including a first digital model of the customized device and/or a second digital model of a mold used during manufacture of the customized device. The system determines an intended property for the customized device based on at least one of the first digital model or the second digital model, determines an actual property of the customized device from the images, determines whether there is a manufacturing defect in the customized device by comparing the intended property for the customized device with the actual property of the customized device, and outputs an output associated with the determination.
