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画像処理装置および方法
专利权人:
富士フイルム株式会社
发明人:
今井 睦朗
申请号:
JP2012039592
公开号:
JP5753502B2
申请日:
2012.02.27
申请国别(地区):
JP
年份:
2015
代理人:
摘要:
PROBLEM TO BE SOLVED: To accurately and efficiently control a periodic pattern caused by a grid when a plurality of radiation images are acquired from radiography using the grid.SOLUTION: A first frequency analysis part 30 executes a frequency analysis for a reference radiation image B1 among a plurality of radiation images acquired from tomosynthesis using a grid to acquire frequency characteristics of a periodic pattern caused by the grid and a result of frequency analysis R0. A second frequency analysis part 31 executes a limited frequency analysis based on the result of frequency analysis for a radiation image Bi (i=2 to n) other than the reference radiation image B1 to acquire frequency characteristics of the periodic pattern on the radiation image Bi. A control part 32 executes a process of controlling periodic patterns of all the radiation images based on the frequency characteristics.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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