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METHOD OF QUALIFYING LIGHT SPOTS FOR OPTICAL MEASUREMENTS AND MEASUREMENT INSTRUMENT EMPLOYING METHOD OF QUALIFYING LIGHT SPOTS
专利权人:
AMO WAVEFRONT SCIENCES; LLC
发明人:
RAYMOND, THOMAS D.,DIXSON, JOHN GRANT,FARRER, STEPHEN W.,XIONG, WEI,NEAL, DANIEL R.
申请号:
CA2970614
公开号:
CA2970614C
申请日:
2009.11.13
申请国别(地区):
CA
年份:
2018
代理人:
摘要:
A method of determining a wavefront of a received light beam includes: (a) receiving a light beam (b) producing a group of light spots from the light beam (c) qualifying a set of the light spots for use in determining a wavefront of the received light beam and (d) determining the wavefront of the received light beam using the qualified set of light spots. Qualifying the set of light spots includes, for each light spot: calculating a first calculated location of the light spot using a first calculation algorithm calculating a second calculated location of the light spot using a second calculation algorithm and when a difference between the first and second calculated locations for the light spot is greater than an agreement threshold, excluding the light spot from the set of light spots and/or from being employed in determining the wavefront of the received light beam.
来源网站:
中国工程科技知识中心
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http://www.ckcest.cn/home/

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