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細隙灯顕微鏡装置
专利权人:
株式会社トプコン
发明人:
山本 諭史,岡下 敏宏
申请号:
JP2011128988
公开号:
JP5860617B2
申请日:
2011.06.09
申请国别(地区):
JP
年份:
2016
代理人:
摘要:
Provided is a slit lamp microscope that examines a patients eye by means of continuous illumination using an LED and can capture images of the eye during the examination by means of pulse illumination using said LED. This slit lamp microscope is equipped with: an illumination optical system (21) that has an LED (51) and illuminates the eye (E) an examination / imaging optical system (6) that has an image pickup element and can capture images of the eye (E) during examination thereof and a control circuit (70) that controls the current flowing in the LED (51), and switches from continuous illumination to pulse illumination by linking the continuous illumination for examination and pulse illumination for imaging to the operation of an imaging switch.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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