#$%^&*AU2012244064A120130516.pdf#####POINT SIZE LIGHT ILLUMINATION IN METROLOGY SYSTEMS FOR IN-SITU SURGICAL APPLICATIONS ABSTRACT A metrology method includes the steps of positioning a point source projector (100) at a known distance from a target site ("S"), projecting a light beam (120) through a semitransparent mask (104), forming a magnified pattern (116) on the target site ("S") from the light beam (120), visually inspecting a portion of the magnified pattern (116) that is formed on the target site ("S"), and determining a measurement of the target site ("S") based on the known dimensions of the mask pattern (106), a magnification factor ("M"), and the portion of the magnified pattern (116) that is formed on the target site ("S"). The light beam (120) diverges from a point and the semi-transparent mask (106) has a mask pattern (106) of known dimensions. The magnified pattern (116) is magnified from the mask pattern (106) by the magnification factor ("M").1/2 122 120 100 -106 116 102 -L----d, d FIG.1 10 "T" d 116 FIG. 2
