ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE;한국과학기술원;한국전자통신연구원;KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
发明人:
BYUN, WOO JIN,변우진,CHO, IN KUI,조인귀,JEONG, JAE SEUNG,정재승,JEONG, DONG HWA,정동화,BYUN, WOO JINKR,CHO, IN KUIKR,JEONG, JAE SEUNGKR,JEONG, DONG HWAKR
申请号：
KR1020120146768
公开号：
KR1020140077694A
申请日:
2012.12.14
申请国别(地区):
KR
年份:
2014
代理人:
摘要：
The present invention relates to an ADHD/ADS diagnosis apparatus using EEG and a method thereof. The ADHD/ADS diagnosis apparatus using EEG according to one embodiment of the present invention includes a measuring part which generates an EEG signal； an analysis part which analyses the EEG signal； and a diagnosis part which diagnoses developmental disability. According to one embodiment of the present invention, the measuring part photographs a line-of-sight region.본 발명은 자폐 범주성 장애 진단 장치 및 방법에 관한 것으로, 뇌파 측정 및 시선 추적을 통해 자폐와 같은 발달 장애의 가능성을 진단할 수 있는 자폐 범주성 장애 진단 장치 및 그 방법에 관한 기술이다.
