Jillian Reno;Scott Penfold;Mark R. Amato;Nick Ruebel;Edward Ivanov;Kyle Schmanke;W. Davis Lee;James P. Bennett;Lauri Reichert;Stephen Sledge
发明人:
James P. Bennett,Kyle Schmanke,Lauri Reichert,Stephen Sledge,Nick Ruebel,Jillian Reno,Edward Ivanov,Mark R. Amato,Scott Penfold,W. Davis Lee
申请号：
US15413066
公开号：
US20170128747A1
申请日:
2017.01.23
申请国别(地区):
US
年份:
2017
代理人:
摘要：
The invention comprises an X-ray—positively charged particle double/dual exposure imaging apparatus and method of use thereof. Double exposure imaging of a tumor of a patient is performed using detector hardware responsive to both X-rays and positively charged particles. A near-simultaneous double exposure yields enhanced resolution due to the imaging rate versus patient movement, no requirement of a software overlay step of the X-ray based image and the positively charged particle based image, and enhancement of an X-ray image, the enhancement resultant from a differing physical interaction of the positively charged particles with the patient compared to interactions of X-rays and the patient. Further, resolution enhancements utilize individual particle tracking, as measured using detection screens, to determine a probable intra-patient path. Residual energy positively charged particles are optionally used to generate a second or dual image at a secondary detector, such as a detector detecting scintillation resultant from proton absorbance.
