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Surface shape measuring device
专利权人:
发明人:
Young-Ho Cho,Jae-Min Kim,Dae-Geon Seo
申请号:
US13852806
公开号:
US09134211B2
申请日:
2013.03.28
申请国别(地区):
US
年份:
2015
代理人:
摘要:
A surface shape measuring device includes a substrate, an electrode portion including at least one electrode pattern, the electrode pattern extending on the substrate, a coating layer on the substrate to cover the electrode pattern, and a detector electrically connected to the electrode pattern and detecting a change in a physical quantity of the electrode pattern generated by the deformation of the substrate or the coating layer by an external load applied thereto.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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