您的位置: 首页 > 农业专利 > 详情页

METHOD FOR CHARACTERIZING A SAMPLE BY MEASUREMENT OF A BACKSCATTERED OPTICAL SIGNAL
专利权人:
Commissariat a L'Energie Atomique et aux Energies Alternatives
发明人:
Blandine ROIG,Anne KOENIG,Jean-Marc DINTEN,Francois PERRAUT
申请号:
US15015306
公开号:
US20160228047A1
申请日:
2016.02.04
申请国别(地区):
US
年份:
2016
代理人:
摘要:
The invention relates to a method for determining an optical property of a sample, comprising the following steps:illumination of a surface of the sample with the aid of a light beam, so as to form, on the surface of the said sample, an elementary illumination zone, corresponding to the part of the said surface illuminated by the said sample;detection of N optical signals, backscattered by the sample, each optical signal emanating from the surface of the sample at a distance, termed the backscattering distance, from the said elementary illumination zone, N being an integer greater than or equal to 1, so as to form as many detected signals;determination of at least one optical property of the sample, by comparison between:a function of each signal thus detected;and a plurality of estimations of the said function each estimation being carried out by considering a predetermined value of the said optical property,the method being characterized in thatduring the said detection step, at least one backscattering distance is less than 200 μm.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充