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DISPOSITIF D'INSPECTION, PROCÉDÉ D'INSPECTION, ET PROGRAMME
专利权人:
Sony Corporation
发明人:
申请号:
EP16783028.0
公开号:
EP3287003A1
申请日:
2016.04.08
申请国别(地区):
EP
年份:
2018
代理人:
摘要:
The present disclosure relates to an inspection apparatus, an inspection method, and a program that allow for more accurate inspection results to be acquired.The inspection apparatus calculates a vegetation index for inspecting the vegetation of a lawn, an inspection target, by cancelling a grain-dependent component included in a taken image of the lawn from the image. Also, the inspection apparatus cancels an imaging-direction-dependent component from the image by performing a calculation process using two images taken with azimuth angles of imaging directions at the time of taking images in directions opposite to each other. Further, the inspection apparatus cancels an angle-dependent component from the image in accordance with a shining direction of light shone on the lawn by performing a calculation process using two images taken with azimuth angles of the shining direction of light shone on the lawn at the time of taking images in directions opposite to each other. The present technology is applicable, for example, to a vegetation inspection apparatus for inspection lawn vegetation.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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