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СПОСОБ ДИАГНОСТИКИ ПАТОЛОГИИ ОКОЛОНОСОВЫХ ПАЗУХ ПУТЕМ РАСПОЗНАВАНИЯ ОБРАЗОВ
专利权人:
SAMOJLENKO ANATOLIJ PETROVICH
发明人:
SAMOJLENKO ANATOLIJ PETROVICH,Самойленко Анатолий Петрович,PRIBYLSKIJ ALEKSEJ VASILEVICH,Прибыльский Алексей Васильевич,VOLKOV ALEKSANDR GRIGOREVICH,Волков Александр Григорьевич,PUZHAEV STANISLAV IGOR
申请号:
RU2014131689/14
公开号:
RU0002585700C2
申请日:
2014.07.30
申请国别(地区):
RU
年份:
2016
代理人:
摘要:
FIELD: medicine.SUBSTANCE: invention relates to medicine, X-ray imaging, digital image processing techniques and statistical methods of image recognition, can be used for diagnosing pathologies of maxillary and frontal sinuses. On X-ray image separating an “area of interest” by contours of sinus (P) and same orbit (O), latter is used as a reference image (EO) for identification and estimation of degree of pathology P. Digitising image contours of sampling and quantisation amplitude intensity pixel brightness on basis of resolution of image source and capacity of computer. Constructing histograms - statistical portraits images of contours P and O with evaluation of their brightness densities M, dispersions D, mean-square deviations (MSD) σ, density factor Kpl (ratio of density Mp of analysed contour P to density Mo of contour of same O, expressed in units of gray scale). Identifying state P from value Kpl= Mp/Mo. For Kpl < 1±σ fixing norm, for Kpl> 1 +σ - pathology P. To increase resolution of diagnosis of condition P image of selected contours of similar P and O are presented as a result of digitisation of same-size matrices of brightness. Forming variation series (VR) with evaluation of span of every VR Δx = xmax-xmin. Determining ratio of extreme elements of series η= xmax/min, in primary approach by estimating condition P: norm - for Δx≅0, η≅1 pathology- Δx≠0, η> 1. Further, nature of pathology P is assessed quantitatively with coefficient of variation of V (ratio of SKO σx to density Mx of corresponding histogram). Pairs of similar contours P and O having a multimodal histogram, segmented by decomposition of each corresponding contour of matrix of intensity values of brightness into L submatrices size nl×n, where nl= n/L, n×n - dimension of initial matrix of contour. Constructing L corresponding histograms and estimate their quantitative characteristics Ml, Dl, σl, Vl, where l is number of segment. By comparative analysis of histograms segments of contours O are
来源网站:
中国工程科技知识中心
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