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光干渉断層画像生成装置用のプローブ
专利权人:
株式会社吉田製作所
发明人:
山中 通三,鹿熊 秀雄
申请号:
JP2013050710
公开号:
JP6173728B2
申请日:
2013.03.13
申请国别(地区):
JP
年份:
2017
代理人:
摘要:
PROBLEM TO BE SOLVED: To provide a probe, with which it is possible to prevent measurement light and scattered light from being blocked by an instrument and reliably image a tomographic image of a subject.SOLUTION: A probe 1 for a light interference tomographic image generation device includes a housing 10 provided with a light path of measurement light and scattered light, irradiates a subject with the measurement light by emitting the measurement light from a tip opening part of the housing 10, and recovers scattered light, which has returned from the subject, from the tip opening part of the housing 10. The tip end part of the housing 10 is provided with an air nozzle 30 that jets air toward the subject.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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