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視野検査システム
专利权人:
学校法人;関西大学
发明人:
小谷 賢太郎,田村 俊樹,朝尾 隆文,堀井 健
申请号:
JP2010029718
公开号:
JP5421146B2
申请日:
2010.02.15
申请国别(地区):
JP
年份:
2014
代理人:
摘要:

PROBLEM TO BE SOLVED: To provide a visual field examination system objectively examining a visual field in a short time, considering the current situation.

SOLUTION: The visual field examination system includes a visual-field-position detection device 1 for detecting the visual-line-position of an examinee P and outputting its visual-line-position detection signal, a presentation device 2 for presenting (displaying) the examinee P with a fixation point (a) and a visual index (b) apart from the fixation point (a) at a prescribed interval, a control device 3 for controlling the presentation device 2 to present the fixation point (a) and the visual index (b), and a notification means 5 for notifying that the visual line of the examinee P does not reach the visual index (b) within a prescribed time.

COPYRIGHT: (C)2011,JPO&INPIT

来源网站:
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