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DISPOSITIF D'ANALYSE, PROCÉDÉ D'ANALYSE, ET SYSTÈME D'ANALYSE
专利权人:
Arkray; Inc.
发明人:
申请号:
EP11747142.5
公开号:
EP2540224A1
申请日:
2011.02.01
申请国别(地区):
EP
年份:
2013
代理人:
摘要:
Provided is a technology capable of acquiring a measurement result with high reliability under a condition exhibiting a large fluctuation in ambient temperature when measuring numerical value information on a specified substance in a sample. An analysis apparatus includes: a signal detection unit to continuously detect signal values detected from a first sample; a measuring unit to measure numerical value information on a specified substance in a second sample; a first temperature detection unit to capture a first temperature value defined as temperature information on the first sample; a second temperature detection unit to capture a second temperature value defined as temperature information on the second sample; and a calculation unit to calibrate to the numerical value information on the specified substance in the first sample from the signal value by referring to the numerical value information on the specified substance in the second sample in accordance with the first temperature value and the second temperature value.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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